Journal ArticleOpen Access
Rapid identification and characterization of genetic loci for defective kernel in bread wheat
Authors
Author Affiliations
Chinese Academy of Agricultural Sciences, Institute of Crop Sciences, Gansu Academy of Agricultural Sciences, International Maize and Wheat Improvement Center
Published InBMC Plant Biology
Year2019
Citations12
Abstract
BACKGROUND: Wheat is a momentous crop and feeds billions of people in the world. The improvement of wheat yield is very important to ensure world food security. Normal development of grain is the essential guarantee for wheat yield formation. The genetic study of grain phenotype and identification of key genes for grain filling are of great significance upon dissecting the molecular mechanism of wheat grain morphogenesis and yield potential. RESULTS: Here we identified a pair of defective kernel (Dek) isogenic lines, BL31 and BL33, with plump and shrunken mature grains, respectively, and constructed a genetic population from the BL31/BL33 cross. Ten chromosomes had higher frequency of polymorphic single nucleotide polymorphism (SNP) markers between BL31 and BL33 using Wheat660K chip. Totally…
View at Publisher
BORR does not host full-text PDFs. The button above takes you to the original publisher.