Structural and morphological properties of aluminum-doped reduced graphene oxide nanomaterials

In this study, we synthesized aluminum-doped reduced graphene oxide (Al-rGO) materials with varying Al concentrations (0%, 6%, 8%, and 12%) and evaluated their structural properties. Comprehensive characterization was performed using techniques such as Energy Dispersive X-ray (EDX) mapping, Scanning Electron Microscopy (SEM), X-ray Diffraction (XRD), Transmission Electron Microscopy (TEM), and Atomic Force Microscopy (AFM). XRD analysis confirmed minor shifts in diffraction peaks, indicating that the r-GO crystal structure was preserved with localized changes due to doping. Raman spectroscopy further validated the integrity of C-C bonds in the graphene oxide structure. SEM analysis revealed uniform deposition of thin films with thicknesses between 110–120 nm, while AFM indicated a significant increase in surface roughness, from 13 nm to 112 nm, with increasing…