Journal ArticleOpen Access
<italic>In Situ</italic> Diagnostics and Prognostics of Solder Fatigue in IGBT Modules for Electric Vehicle Drives
Authors
Author Affiliations
Newcastle University, Queen's University Belfast, Queens University, University of Strathclyde
Published InIEEE Transactions on Power Electronics
Year2014
Citations195
Abstract
This paper proposes an in situ diagnostic and prognostic (D&P) technology to monitor the health condition of insulated gate bipolar transistors (IGBTs) used in EVs with a focus on the IGBTs' solder layer fatigue. IGBTs' thermal impedance and the junction temperature can be used as health indicators for through-life condition monitoring (CM) where the terminal characteristics are measured and the devices' internal temperature-sensitive parameters are employed as temperature sensors to estimate the junction temperature. An auxiliary power supply unit, which can be converted from the battery's 12-V dc supply, provides power to the in situ test circuits and CM data can be stored in the on-board data-logger for further offline analysis. The proposed method is experimentally validated on the developed…
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Fields & Keywords
Physical SciencesEngineeringElectrical and Electronic EngineeringSilicon Carbide Semiconductor TechnologiesElectronic Packaging and Soldering TechnologiesSilicon and Solar Cell TechnologiesElectrical engineeringElectronic engineeringReliability engineeringMeteorologyComposite materialQuantum mechanics